发明名称 Display device
摘要 A shift register circuit has a plurality of shift pulse generation circuits, and a scanning voltage generation circuit has a plurality of base circuits. The base circuits are presented with a first shift pulse generated by a shift pulse generation circuit, and a scanning line clock. The base circuits have a first transistor in which the first shift pulse is input to a first electrode, and a first power supply voltage is input to a control electrode; and a second transistor in which a control electrode is connected to a second electrode in the first transistor, a scanning line clock is input to the first electrode, and the second electrode is connected to a scanning voltage output terminal. The base circuits output a selected scanning voltage synchronized with the scanning line clock from the scanning voltage output terminal when the first shift pulse is at a first voltage level.
申请公布号 US8872749(B2) 申请公布日期 2014.10.28
申请号 US200812155981 申请日期 2008.06.12
申请人 Japan Display Inc.;Panasonic Liquid Crystal Display Co., Ltd. 发明人 Shigaki Takumi;Sato Hideo;Maki Masahiro
分类号 G09G3/36;G11C19/18 主分类号 G09G3/36
代理机构 Bacon & Thomas PLLC 代理人 Marquez Juan Carlos A.;Bacon & Thomas PLLC
主权项 1. A display device comprising: a plurality of pixels; a plurality of scanning lines; and a plurality of common lines; a scanning line drive circuit; and a common line drive circuit; wherein the scanning line drive circuit has a shift register circuit and a scanning voltage generation circuit for generating a scanning voltage; the shift register circuit has a plurality of shift pulse generation circuits for generating a first shift pulse and second shift pulse; the scanning voltage generation circuit has a plurality of base circuits; each one of the shift pulse generation circuits corresponds to n of the base circuits and provides shift pulse inputs to drive n gate lines, where n is an integral number of 2 or greater; the first shift pulse and the second shift pulse generated by the shift pulse generation circuit and corresponding to each of the plurality of base circuits are input into the each of the plurality of base circuits in the scanning voltage generation circuit; first through nth scanning line clocks are input into the plurality of base circuits, wherein a first scanning line clock is input to a respective first base circuit of the scanning voltage generation circuit and an nth scanning line clock is input to a respective nth base circuit of the scanning voltage generation circuit; each of the plurality of base circuits in the scanning voltage generation circuit respectively has: a first transistor including a first electrode to which the first shift pulse generated by the shift pulse generation circuit provided in the shift register circuit is input, a control electrode to which a fixed first power supply voltage is input and a second electrode, and a second transistor including a control electrode connected to the second electrode in the first transistor, a first electrode to which one of the first through nth scanning line clocks is input, and a second electrode connected to a scanning voltage output terminal; each of the plurality of base circuits outputs a selected scanning voltage synchronized with inputting one of the first through nth scanning line clocks from the scanning voltage output terminal when the first shift pulse that has been input is at a first voltage level, wherein the first through nth scanning line clocks are inputted having at least one of mutually different phases relative to each other and identical phases relative to each other in response to a selection of at least one of a gate line sequential drive method and a multiple gate line drive method of the plurality of pixels, and the common line drive circuit determines an AC drive method of the plurality of pixels, wherein the first through nth scanning line clocks have mutually different phases relative to each other in response to a selection of the gate line sequential drive method and the first through nth scanning line clocks have identical phases relative to each other in response to a selection of the multiple gate line drive method.
地址 Tokyo JP