发明名称 |
Method for fabricating backside-illuminated sensors |
摘要 |
A method for fabricating a backside-illuminated sensor includes providing a thin film semiconductor lamina having a first conductivity, and forming a doped region having a second conductivity within the lamina and at a front surface of the lamina. The lamina may be provided as a free-standing lamina, or may be provided as a semiconductor donor body from which the lamina is cleaved. An electrical connection is formed to the doped region. A temporary carrier is contacted to the back surface of the semiconductor and later removed. A backside-illuminated sensor is fabricated from the semiconductor lamina, in which the thickness of the semiconductor lamina remains substantially unchanged during the fabrication process. |
申请公布号 |
US8871608(B2) |
申请公布日期 |
2014.10.28 |
申请号 |
US201213425877 |
申请日期 |
2012.03.21 |
申请人 |
GTAT Corporation |
发明人 |
Murali Venkatesan;Chari Arvind;Prabhu Gopal;Petti Christopher J. |
分类号 |
H01L31/0232 |
主分类号 |
H01L31/0232 |
代理机构 |
The Mueller Law Office, P.C. |
代理人 |
The Mueller Law Office, P.C. |
主权项 |
1. A method of fabricating a backside-illuminated sensor, the method comprising the steps of:
providing a thin film semiconductor lamina having a front surface, a back surface and a thickness between the front surface and the back surface, wherein the semiconductor lamina has a first conductivity, the semiconductor lamina having a doped region formed within the semiconductor lamina at the front surface of the lamina, wherein the doped region has a second conductivity; contacting a temporary carrier to the back surface of the semiconductor lamina; forming an electrical connection to the doped region at the front side of the semiconductor lamina; removing the temporary carrier from the back surface; and fabricating a backside-illuminated sensor from the semiconductor lamina, wherein the thickness of the semiconductor lamina remains substantially unchanged during fabrication of the backside illuminated sensor. |
地址 |
Merrimack NH US |