发明名称 Method for fabricating backside-illuminated sensors
摘要 A method for fabricating a backside-illuminated sensor includes providing a thin film semiconductor lamina having a first conductivity, and forming a doped region having a second conductivity within the lamina and at a front surface of the lamina. The lamina may be provided as a free-standing lamina, or may be provided as a semiconductor donor body from which the lamina is cleaved. An electrical connection is formed to the doped region. A temporary carrier is contacted to the back surface of the semiconductor and later removed. A backside-illuminated sensor is fabricated from the semiconductor lamina, in which the thickness of the semiconductor lamina remains substantially unchanged during the fabrication process.
申请公布号 US8871608(B2) 申请公布日期 2014.10.28
申请号 US201213425877 申请日期 2012.03.21
申请人 GTAT Corporation 发明人 Murali Venkatesan;Chari Arvind;Prabhu Gopal;Petti Christopher J.
分类号 H01L31/0232 主分类号 H01L31/0232
代理机构 The Mueller Law Office, P.C. 代理人 The Mueller Law Office, P.C.
主权项 1. A method of fabricating a backside-illuminated sensor, the method comprising the steps of: providing a thin film semiconductor lamina having a front surface, a back surface and a thickness between the front surface and the back surface, wherein the semiconductor lamina has a first conductivity, the semiconductor lamina having a doped region formed within the semiconductor lamina at the front surface of the lamina, wherein the doped region has a second conductivity; contacting a temporary carrier to the back surface of the semiconductor lamina; forming an electrical connection to the doped region at the front side of the semiconductor lamina; removing the temporary carrier from the back surface; and fabricating a backside-illuminated sensor from the semiconductor lamina, wherein the thickness of the semiconductor lamina remains substantially unchanged during fabrication of the backside illuminated sensor.
地址 Merrimack NH US