发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
<p>The present invention relates to a semiconductor device which includes a first semiconductor region of a first conductive type, a second semiconductor region of a second conductive type which is formed on one surface of the first semiconductor region, a third semiconductor region of the first conductive type which is formed on one surface of the second semiconductor region, a gate electrode which passes through the third semiconductor region in a depth direction and is located in a trench which is formed to reach the inner side of the second semiconductor region, a first insulation layer which is formed between the gate electrode and the third semiconductor region, a second insulation layer which is formed between the gate electrode and the second semiconductor region, and a fourth semiconductor region of the second conductive type which is formed on a part of one surface of the third semiconductor region. The thickness of a part of the second insulation layer is thicker than the thickness of the first insulation layer.</p> |
申请公布号 |
KR20140124898(A) |
申请公布日期 |
2014.10.28 |
申请号 |
KR20120141453 |
申请日期 |
2012.12.06 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO., LTD. |
发明人 |
PARK, JAE HOON;SONG, IN HYUK;UM, KEE JU;SEO, DONG SOO |
分类号 |
H01L29/739;H01L21/331;H01L29/78 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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