发明名称 SEMICONDUCTOR DEVICE
摘要 <p>The present invention relates to a semiconductor device which includes a first semiconductor region of a first conductive type, a second semiconductor region of a second conductive type which is formed on one surface of the first semiconductor region, a third semiconductor region of the first conductive type which is formed on one surface of the second semiconductor region, a gate electrode which passes through the third semiconductor region in a depth direction and is located in a trench which is formed to reach the inner side of the second semiconductor region, a first insulation layer which is formed between the gate electrode and the third semiconductor region, a second insulation layer which is formed between the gate electrode and the second semiconductor region, and a fourth semiconductor region of the second conductive type which is formed on a part of one surface of the third semiconductor region. The thickness of a part of the second insulation layer is thicker than the thickness of the first insulation layer.</p>
申请公布号 KR20140124898(A) 申请公布日期 2014.10.28
申请号 KR20120141453 申请日期 2012.12.06
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 PARK, JAE HOON;SONG, IN HYUK;UM, KEE JU;SEO, DONG SOO
分类号 H01L29/739;H01L21/331;H01L29/78 主分类号 H01L29/739
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