发明名称 Methods and systems for compressed sensing analog to digital conversion
摘要 Disclosed herein are example methods, systems, and devices for compressed sensing analog to digital conversion. In an example embodiment, a multiplication circuit is configured to multiply an input signal with a measurement signal to produce a multiplied signal, where the measurement signal includes data from a column of a measurement matrix. The measurement matrix may be generated by a linear feedback shift register (LFSR)-based measurement-matrix generator. An integration circuit may be coupled to the multiplication circuit and configured to integrate the multiplied signal for a predefined amount of time to produce an integrated signal. An analog to digital converter (ADC) circuit may be coupled to the integration circuit and configured to (i) sample the integrated signal and (ii) produce an output signal comprising at least one sample of the integrated signal. A column-wise multiplication of the input signal with the measurement signal enables an efficient compressed-sensing analog-to-digital conversion architecture.
申请公布号 US8872688(B2) 申请公布日期 2014.10.28
申请号 US201113810036 申请日期 2011.07.13
申请人 University of Washington through its Center for Commercialization 发明人 Gangopadhyay Daibashish;Allstot David
分类号 H03M1/12;H03M1/38 主分类号 H03M1/12
代理机构 McDonnell Boehnen Hulbert & Berghoff LLP 代理人 McDonnell Boehnen Hulbert & Berghoff LLP
主权项 1. A circuit comprising: a multiplication circuit configured to multiply an input signal with a measurement signal to produce a multiplied signal, wherein the measurement signal comprises data from a column of a measurement matrix, wherein the measurement-matrix comprises a plurality of entries; a measurement-matrix generator coupled to the multiplication circuit, wherein the measurement-matrix generator is configured to generate a random coefficient for each entry in the measurement matrix; an integration circuit coupled to the multiplication circuit and configured to integrate the multiplied signal for a predefined amount of time to produce an integrated signal; and an analog to digital converter (ADC) circuit coupled to the integration circuit and configured to (i) sample the integrated signal and (ii) produce an output signal comprising at least one sample of the integrated signal.
地址 Seattle WA US