发明名称 |
Integrated circuit structure having air-gap trench isolation and related design structure |
摘要 |
A method of forming an integrated circuit structure includes: forming a vent via extending through a shallow trench isolation (STI) and into a substrate; selectively removing an exposed portion of the substrate at a bottom of the vent via to form an opening within the substrate, wherein the opening within the substrate abuts at least one of a bottom surface or a sidewall of the STI; and sealing the vent via to form an air gap in the opening within the substrate. |
申请公布号 |
US8872305(B2) |
申请公布日期 |
2014.10.28 |
申请号 |
US201314073178 |
申请日期 |
2013.11.06 |
申请人 |
International Business Machines Corporation |
发明人 |
Camillo-Castillo Renata A.;Dunn James S.;Harame David L.;Stamper Anthony K. |
分类号 |
H01L29/737;H01L21/764;H01L21/762;H01L29/06 |
主分类号 |
H01L29/737 |
代理机构 |
Hoffman Warnick LLC |
代理人 |
Canale Anthony J.;Hoffman Warnick LLC |
主权项 |
1. A transistor structure comprising:
a substrate; a shallow trench isolation (STI) located within the substrate; a base region overlying the STI; a collector region separated from the base region by the substrate; an air gap region within the substrate, the air gap region abutting at least one of a lower surface of the STI or a sidewall of the STI; and a cap layer sealing the air gap region. |
地址 |
Armonk NY US |