发明名称 Integrated circuit structure having air-gap trench isolation and related design structure
摘要 A method of forming an integrated circuit structure includes: forming a vent via extending through a shallow trench isolation (STI) and into a substrate; selectively removing an exposed portion of the substrate at a bottom of the vent via to form an opening within the substrate, wherein the opening within the substrate abuts at least one of a bottom surface or a sidewall of the STI; and sealing the vent via to form an air gap in the opening within the substrate.
申请公布号 US8872305(B2) 申请公布日期 2014.10.28
申请号 US201314073178 申请日期 2013.11.06
申请人 International Business Machines Corporation 发明人 Camillo-Castillo Renata A.;Dunn James S.;Harame David L.;Stamper Anthony K.
分类号 H01L29/737;H01L21/764;H01L21/762;H01L29/06 主分类号 H01L29/737
代理机构 Hoffman Warnick LLC 代理人 Canale Anthony J.;Hoffman Warnick LLC
主权项 1. A transistor structure comprising: a substrate; a shallow trench isolation (STI) located within the substrate; a base region overlying the STI; a collector region separated from the base region by the substrate; an air gap region within the substrate, the air gap region abutting at least one of a lower surface of the STI or a sidewall of the STI; and a cap layer sealing the air gap region.
地址 Armonk NY US