发明名称 Nonvolatile memory device and method for fabricating the same
摘要 The technology of the present invention relates to a non-volatile memory device and a fabrication method thereof. The non-volatile memory device includes channel layers protruding vertically from a substrate, a plurality of hole-supply layers and a plurality of gate electrodes, which are alternately stacked along the channel layers, and a memory film interposed between the channel layers and the gate electrodes and between the hole-supply layers and the gate electrodes. According to this technology, the hole-supply layers are formed between the memory cells such that sufficient holes are supplied to the memory cells during the erase operation of the memory cells, whereby the erase operation of the memory cells is smoothly performed without using the GIDL current, and the properties of the device are protected from being deteriorated due to program/erase cycling.
申请公布号 US8872249(B2) 申请公布日期 2014.10.28
申请号 US201213604316 申请日期 2012.09.05
申请人 SK Hynix Inc. 发明人 Jung Sung-Wook
分类号 H01L23/532 主分类号 H01L23/532
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A non-volatile memory device comprising: channel layers extending perpendicular from a substrate; a plurality of hole-supply layers, each including a doped semiconductor material stacked along a length of the channel layers; a plurality of gate electrodes alternately stacked between the plurality of hole supply layers along the length of the channel layers; and a memory layer interposed between the channel layers and the plurality of gate electrodes, and between the plurality of hole-supply layers and the plurality of gate electrodes.
地址 Gyeonggi-do KR