发明名称 MOCK-UP TEST JIG FOR CONTAINER SHIP
摘要 而⑦�: A jig for a mock up test of a container ship is disclosed. According to an embodiment of the present invention, the jig is formed with a framework and comprises a primary stepped structure and a secondary stepped structure. The primary stepped structure is designed to have a size corresponding to that of a standardized first container. The secondary stepped structure is formed with a framework, and detachably combined to an upper part of the primary stepped structure. The length of a lower part combined to the primary structure is formed to correspond to the length of a secondary container, and the height of the secondary stepped structure is formed to correspond to a gross height of piled multiple secondary containers.
申请公布号 KR101455643(B1) 申请公布日期 2014.10.28
申请号 KR20130049328 申请日期 2013.05.02
申请人 SAMSUNG HEAVY IND. CO., LTD. 发明人 KIM, DAE HO;PARK, KEE DUCK
分类号 B63B25/00;B63B9/00;G01M99/00 主分类号 B63B25/00
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