发明名称 Semiconductor device and method for fabricating the same
摘要 A semiconductor device and a method for fabricating the same are provided to prevent a floating body effect and reduce coupling capacitance between buried bit lines. The semiconductor device comprises a first pillar disposed over a semiconductor substrate and including a vertical channel region, a bit line located in the lower portion of the vertical channel region inside the first pillar and a semiconductor layer extended from the semiconductor substrate to one sidewall of the first pillar.
申请公布号 US8872259(B2) 申请公布日期 2014.10.28
申请号 US201213445798 申请日期 2012.04.12
申请人 Hynix Semiconductor Inc. 发明人 Kim Seung Hwan;Sim Jai Hoon
分类号 H01L29/66;H01L27/108;H01L27/02 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor device, comprising: a first pillar disposed over a semiconductor substrate and including a first vertical channel region; a second pillar disposed over the semiconductor substrate and adjacent to the first pillar, the second pillar including a second vertical channel region; a bit line located in lower portions of the first and second vertical channel regions; and a semiconductor layer extending from the semiconductor substrate to a first sidewall of the first pillar and a first sidewall of the second pillar adjacent to the first sidewall of the first pillar, the semiconductor layer connecting the semiconductor substrate, the first vertical channel and the second vertical channel, wherein the semiconductor layer has an upper surface extending in a single plane between the first sidewall of the first pillar and the first sidewall of the second pillar.
地址 Icheon KR