发明名称 PLANAR DISPLAY DEVICE AND INSPECTION METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To enable a short-circuit of wirings arrayed in a matrix such as the short-circuit among sensor wirings to be easily detected and particularly to simplify a structure of an inspection device in a planar display device and the inspection device of the same.SOLUTION: Each sensor 11 in a wiring group 22 is made conductive to one inspection pad 27 through a switching element 25 provided on its end part, respectively. Further, an odd-numbered sensor wiring 11A only or an even-numbered sensor wiring 11B only can be made conductive to the inspection pad 27 by the first/second switching control wirings 23, 24 for turning on/off these switching elements 25. In order to inspect the short-circuit among adjacent wirings, first of all, the odd-numbered sensor wiring 11A only is made conductive to the inspection pad 27 to be applied with a voltage. Then, the even-numbered sensor wirings 11B only are made conductive to the inspection part 27 to measure a discharge current.</p>
申请公布号 JP2014202907(A) 申请公布日期 2014.10.27
申请号 JP20130078668 申请日期 2013.04.04
申请人 JAPAN DISPLAY INC 发明人 HARADA KENJI
分类号 G09F9/00;G02F1/1333;G02F1/1343;G09F9/30;G09G3/20;G09G3/36 主分类号 G09F9/00
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