发明名称 |
ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To reduce influences by air bubbles and dusts on scattered light measurement with an automatic analysis apparatus.SOLUTION: A first wavelength 18a on a short wavelength side and a second wavelength 18b on a long wavelength side are emitted from a light source, and transmitted beams 19a, 19b and scattered beams 21a, 21b are received. Noise is estimated from a transmitted beam intensity ratio of the first wavelength and the second wavelength and from a change in amount of light of the scattered beam of the second wavelength. Subtraction is applied to a change in amount of light of the scattered beam of the first wavelength to reduce noise due to air bubbles and dusts. |
申请公布号 |
JP2014202523(A) |
申请公布日期 |
2014.10.27 |
申请号 |
JP20130076932 |
申请日期 |
2013.04.02 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
YOGI TAKESHI;ADACHI SAKUICHIRO;YAMAZAKI SO |
分类号 |
G01N21/49;G01N35/00;G01N35/04 |
主分类号 |
G01N21/49 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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