发明名称 ANALYSIS APPARATUS AND AUTOMATIC ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To reduce influences by air bubbles and dusts on scattered light measurement with an automatic analysis apparatus.SOLUTION: A first wavelength 18a on a short wavelength side and a second wavelength 18b on a long wavelength side are emitted from a light source, and transmitted beams 19a, 19b and scattered beams 21a, 21b are received. Noise is estimated from a transmitted beam intensity ratio of the first wavelength and the second wavelength and from a change in amount of light of the scattered beam of the second wavelength. Subtraction is applied to a change in amount of light of the scattered beam of the first wavelength to reduce noise due to air bubbles and dusts.
申请公布号 JP2014202523(A) 申请公布日期 2014.10.27
申请号 JP20130076932 申请日期 2013.04.02
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 YOGI TAKESHI;ADACHI SAKUICHIRO;YAMAZAKI SO
分类号 G01N21/49;G01N35/00;G01N35/04 主分类号 G01N21/49
代理机构 代理人
主权项
地址