发明名称 |
PROCESS OF MANUFACTURING WIDE-GAP SEMICONDUCTOR DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a pseudo CMOS circuit and a p-channel junction FET composed of a wide-gap semiconductor capable of stably operating even under high temperature environment.SOLUTION: The process of manufacturing a pseudo CMOS device is constituted of a junction FET that drives holes inside a bulk and an n-channel MOS concerning a wide-gap semiconductor substrate.</p> |
申请公布号 |
JP2014203991(A) |
申请公布日期 |
2014.10.27 |
申请号 |
JP20130079275 |
申请日期 |
2013.04.05 |
申请人 |
ADACHI NAOSHI |
发明人 |
ADACHI NAOSHI;NAKAJIMA HIROSHI |
分类号 |
H01L29/78;H01L21/336;H01L21/8234;H01L27/06;H01L27/095 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|