发明名称 PROCESS OF MANUFACTURING WIDE-GAP SEMICONDUCTOR DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a pseudo CMOS circuit and a p-channel junction FET composed of a wide-gap semiconductor capable of stably operating even under high temperature environment.SOLUTION: The process of manufacturing a pseudo CMOS device is constituted of a junction FET that drives holes inside a bulk and an n-channel MOS concerning a wide-gap semiconductor substrate.</p>
申请公布号 JP2014203991(A) 申请公布日期 2014.10.27
申请号 JP20130079275 申请日期 2013.04.05
申请人 ADACHI NAOSHI 发明人 ADACHI NAOSHI;NAKAJIMA HIROSHI
分类号 H01L29/78;H01L21/336;H01L21/8234;H01L27/06;H01L27/095 主分类号 H01L29/78
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