| 摘要 |
<p>An apparatus (1) for detecting a 3D structure of an object comprises a first laser emitter (2a), which generates laser radiation having a first wavelength, a second laser emitter (2b), which generates laser radiation having a second wavelength, wherein the first wavelength differs from the second wavelength, optical devices (4, 9, 10, 13, 14), of which at least one is a beam splitter (4), which splits the laser radiation of the laser emitters (2, 2a, 2b) in each case into a reference radiation (5) and an illuminating radiation (6), wherein the illuminating radiation (6) impinges upon the object (15) to be measured, is reflected by the object (15) as object radiation (21) and interferes with the reference radiation (5), and a detector (12), which receives the interference patterns formed therefrom. The laser emitters (2, 2a, 2b) are located in such a manner that the illuminating radiation (6) of the first laser emitter (2a) and the illuminating radiation (6) of the second laser emitter (2b) impinge upon the object (15) at different angles of incidence. The apparatus (1) further comprises a measuring device (27), which measures the two wavelengths of the laser radiation of the laser emitters (2, 2a, 2b) and influences the recording of the interference patterns.</p> |
