THREE-DIMENSIONAL MEASURING DEVICE, THREE-DIMENSIONAL MEASURING METHOD, AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To improve the measuring accuracy of three-dimensional measurement.SOLUTION: A projection section 102 is configured so that a feature pattern is disposed to pair it with one pattern for measurement, pattern light including a region having a luminance or wavelength different from that of the pattern for measurement is projected between the pattern for measurement and feature pattern or to the feature pattern, and, even when the peak of the luminance varies, the center of gravity of the pattern for measurement does not vary and a three-dimensional shape can be measured accurately.