发明名称 Circuits and Methods for Generating a Self-Test of a Magnetic Field Sensor
摘要 A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal operation.
申请公布号 US2014312883(A1) 申请公布日期 2014.10.23
申请号 US201414321347 申请日期 2014.07.01
申请人 Allegro MicroSystems, LLC 发明人 Friedrich Andreas P.;Foletto Andrea;Doogue Michael C.;Taylor William P.;Vig Ravi;Scheller P. Karl
分类号 G01R33/00;G01R35/00 主分类号 G01R33/00
代理机构 代理人
主权项 1. A magnetic field sensor comprising: a magnetic field sensing element supported by a substrate, wherein the magnetic field sensing element is configured to generate a self-test signal responsive to a pulsing self-test magnetic field during one or more self-test time periods; a self-test circuit supported by the substrate, the self-test circuit comprising: a self-test current conductor proximate to the magnetic field sensing element, the self-test current conductor for carrying a self-test current to generate the self-test magnetic field;a processing circuit coupled to receive a signal representative of the self-test signal; anda diagnostic request processor configured to control the self-test current to be on or off in response to a diagnostic input signal received by the diagnostic request processor or to be indicative of a self-test during one or more time periods in response to a control signal generated by the diagnostic request processor.
地址 Worcester MA US