发明名称 |
Circuits and Methods for Generating a Self-Test of a Magnetic Field Sensor |
摘要 |
A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field sensing element used within the magnetic field sensor, while the magnetic field sensor is functioning in normal operation. |
申请公布号 |
US2014312883(A1) |
申请公布日期 |
2014.10.23 |
申请号 |
US201414321347 |
申请日期 |
2014.07.01 |
申请人 |
Allegro MicroSystems, LLC |
发明人 |
Friedrich Andreas P.;Foletto Andrea;Doogue Michael C.;Taylor William P.;Vig Ravi;Scheller P. Karl |
分类号 |
G01R33/00;G01R35/00 |
主分类号 |
G01R33/00 |
代理机构 |
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代理人 |
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主权项 |
1. A magnetic field sensor comprising:
a magnetic field sensing element supported by a substrate, wherein the magnetic field sensing element is configured to generate a self-test signal responsive to a pulsing self-test magnetic field during one or more self-test time periods; a self-test circuit supported by the substrate, the self-test circuit comprising:
a self-test current conductor proximate to the magnetic field sensing element, the self-test current conductor for carrying a self-test current to generate the self-test magnetic field;a processing circuit coupled to receive a signal representative of the self-test signal; anda diagnostic request processor configured to control the self-test current to be on or off in response to a diagnostic input signal received by the diagnostic request processor or to be indicative of a self-test during one or more time periods in response to a control signal generated by the diagnostic request processor. |
地址 |
Worcester MA US |