发明名称 |
TEST SUPPORT PROGRAM, TEST SUPPORT DEVICE, AND TEST SUPPORT METHOD |
摘要 |
PROBLEM TO BE SOLVED: To support test work.SOLUTION: A test support device 101 acquires an identifier of information processing to be tested. The test support device 101 searches for a schema corresponding to the identifier of the information processing to be tested from a storage part 103 when the identifier of the information processing to be tested is acquired. The test support device 101 refers to the searched scheme for a request and identifies an item name of an input item to be an input of the information processing to be tested. The test support device 101 generates screen information on an input screen for inputting an item value of the input item on the basis of the item name of the identified input item. The test support device 101 outputs the screen information on the generated input screen. |
申请公布号 |
JP2014199603(A) |
申请公布日期 |
2014.10.23 |
申请号 |
JP20130075082 |
申请日期 |
2013.03.29 |
申请人 |
FUJITSU LTD |
发明人 |
SASAKI JUN;TAKAHASHI KAZUYA |
分类号 |
G06F11/28 |
主分类号 |
G06F11/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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