发明名称 SCANNING INSTRUMENT
摘要 <p>PROBLEM TO BE SOLVED: To provide a scanning instrument capable of acquiring the position and inclination of a central axis with a high degree of accuracy, in terms of an implant fixture for an implant bridge.SOLUTION: Scanning instruments (10 and 110) for being attached to an analog of a model, in which the analog (20) is embedded, include cylindrical bodies (11 and 111), a fixing member (12) for attaching the body to the analog, and a reference point (13) for obtaining information on the position and inclination of the central axis of the analog by a pattern projection method.</p>
申请公布号 JP2014198132(A) 申请公布日期 2014.10.23
申请号 JP20130074674 申请日期 2013.03.29
申请人 GC CORP 发明人 MIYOSHI AI
分类号 A61C8/00;A61C19/04 主分类号 A61C8/00
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