发明名称 |
Wafer Backside Interconnect Structure Connected to TSVs |
摘要 |
An integrated circuit structure includes a semiconductor substrate having a front surface and a back surface; a conductive via passing through the semiconductor substrate; and a metal feature on the back surface of the semiconductor substrate. The metal feature includes a metal pad overlying and contacting the conductive via, and a metal line over the conductive via. The metal line includes a dual damascene structure. The integrated circuit structure further includes a bump overlying the metal line. |
申请公布号 |
US2014312494(A1) |
申请公布日期 |
2014.10.23 |
申请号 |
US201414323617 |
申请日期 |
2014.07.03 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chen Ming-Fa;Chiou Wen-Chih;Shue Shau-Lin |
分类号 |
H01L23/00;H01L23/48 |
主分类号 |
H01L23/00 |
代理机构 |
|
代理人 |
|
主权项 |
1. An integrated circuit structure comprising:
a semiconductor substrate having a front surface and a back surface; a conductive via in the semiconductor substrate; a first metal feature extending from the back surface of the semiconductor substrate into the semiconductor substrate and contacting the conductive via; and a bump overlying and electrically connected to the first metal feature. |
地址 |
Hsin-Chu TW |