发明名称 METHOD AND HARDWARE FOR CLEANING UV CHAMBERS
摘要 A cleaning method for a UV chamber involves providing a first cleaning gas, a second cleaning gas, and a purge gas to one or more openings in the chamber. The first cleaning gas may be an oxygen containing gas, such as ozone, to remove carbon residues. The second cleaning gas may be a remote plasma of NF3 and O2 to remove silicon residues. The UV chamber may have two UV transparent showerheads, which together with a UV window in the chamber lid, define a gas volume proximate the UV window and a distribution volume below the gas volume. A purge gas may be flowed through the gas volume while one or more of the cleaning gases is flowed into the distribution volume to prevent the cleaning gases from impinging on the UV transparent window.
申请公布号 WO2014116304(A3) 申请公布日期 2014.10.23
申请号 WO2013US55594 申请日期 2013.08.19
申请人 APPLIED MATERIALS, INC. 发明人 BALUJA, SANJEEV;DEMOS, ALEXANDROS T.;CHAN, KELVIN;ROCHA-ALVAREZ, JUAN CARLOS;HENDRICKSON, SCOTT A.;KANGUDE, ABHIJIT;TUREVSKY, INNA;CHHABRA, MAHENDRA;NOWAK, THOMAS;YAO, DAPING;XIE, BO;RAJ, DAEMIAN
分类号 H01L21/302;H01L21/02 主分类号 H01L21/302
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