发明名称 GAS BARRIER LAYER WITH OXIDE SEMICONDUCTOR THIN FILMS AND FABRICATION METHOD THEREOF
摘要 <p>The present invention relates to a gas barrier layer including an oxide semiconductor thin film. The gas barrier layer is properly used as a sealing material capable of reducing the permeation of gas like oxygen and water, being stably bent, being transparent, preventing the function degradation of electrical and electronic devices, and improving stability.</p>
申请公布号 KR20140123610(A) 申请公布日期 2014.10.23
申请号 KR20130038590 申请日期 2013.04.09
申请人 KANEKA CORPORATION;RESEARCH & BUSINESS FOUNDATION SUNGKYUNKWAN UNIVERSITY 发明人 LEE, JUN YOUNG;BOO YONG SOON;FUJIHARA KAN;KIM, SUNG HEE;JEON, SO YUN
分类号 H01L51/52;H01L51/56;H05B33/22 主分类号 H01L51/52
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