发明名称 CMP研磨液及びこれを用いた基板の研磨方法
摘要 <p>Disclosed is a CMP polishing liquid for polishing a substrate having a layer containing ruthenium, comprising: an oxidizing agent; polishing particles; water; and a compound having a structure represented by the following Formula (1), or a salt thereof. This CMP liquid is improved in at least the polishing rate to a ruthenium layer when compared with conventional polishing liquid. Also disclosed is a method for polishing a substrate using such a CMP polishing liquid.</p>
申请公布号 JP5610020(B2) 申请公布日期 2014.10.22
申请号 JP20130071902 申请日期 2013.03.29
申请人 发明人
分类号 H01L21/304;B24B37/00;B24B37/04;C09K3/14 主分类号 H01L21/304
代理机构 代理人
主权项
地址