发明名称 |
MEASUREMENT BY MEANS OF ATOM INTERFEROMETRY |
摘要 |
<p>The invention relates to a measurement by means of atom interferometry, using a Raman source that is created by modulating a monochromatic laser source. By conveniently selecting positions in which interactions between atoms and a laser radiation, produced by the Raman source, are caused, it is possible to eliminate or at least reduce a measurement bias caused by supplementary components of the laser radiation. Such a measurement having eliminated or reduced bias can be used in an inertia sensor.</p> |
申请公布号 |
EP2791620(A1) |
申请公布日期 |
2014.10.22 |
申请号 |
EP20120816719 |
申请日期 |
2012.12.12 |
申请人 |
ONERA (OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AÉROSPATIALES) |
发明人 |
BIDEL, YANNICK;ZAHZAM, NASSIM;BRESSON, ALEXANDRE |
分类号 |
G01V7/02;G01C19/58;G01P15/00;G01V7/00;G21K1/00 |
主分类号 |
G01V7/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|