发明名称 半導体装置の製造方法
摘要 <p>A semiconductor device has a substrate (1); a multi-layered interconnect formed on the substrate, and having a plurality of interconnect layers, each of which being configured by an interconnect and an insulating layer, stacked therein; a memory circuit (200) formed in a memory circuit region on the substrate in a plan view, and having a peripheral circuit and at least one capacitor element (19) embedded in the multi-layered interconnect; and a logic circuit (100) formed in a logic circuit region on the substrate, wherein the capacitor element is configured by a lower electrode (14), a capacitor insulating film (15), an upper electrode (16), an embedded electrode and an upper interconnect (18); the top surface of the upper interconnect, and the top surface of the interconnect (80) configuring the logic circuit formed in the same interconnect layer with the upper interconnect, are aligned to the same plane.</p>
申请公布号 JP5613033(B2) 申请公布日期 2014.10.22
申请号 JP20100270310 申请日期 2010.12.03
申请人 发明人
分类号 H01L21/8242;H01L21/3205;H01L21/768;H01L23/522;H01L27/10;H01L27/108 主分类号 H01L21/8242
代理机构 代理人
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