发明名称 物体の少なくとも部分的に反射する表面を光学的に検査するための方法および装置
摘要 <p>#CMT# #/CMT# The method involves providing a sample (28) with multiple lighter and darker areas (30,32) which form spatial intensity sequences (34,36) with a spatial period. An object (50) is positioned with a surface (52) relative to the sample such that the intensity sequences drop at the surface. #CMT# : #/CMT# Independent claims are also included for the following: (1) a device for optical inspection of a partially reflective surface at an object; and (2) a computer program with program code. #CMT#USE : #/CMT# Method for optical inspection of a partially reflective surface at an object. #CMT#ADVANTAGE : #/CMT# The method involves providing a sample with multiple lighter and darker areas which form a spatial intensity sequence with a spatial period, and thus ensures accurate and cost-effective optical inspection method. #CMT#DESCRIPTION OF DRAWINGS : #/CMT# The drawing shows a side view of an optical inspection device. 28 : Sample 30,32 : Areas 34,36 : Intensity sequences 50 : Object 52 : Surface.</p>
申请公布号 JP5612891(B2) 申请公布日期 2014.10.22
申请号 JP20100087388 申请日期 2010.04.05
申请人 发明人
分类号 G01N21/88 主分类号 G01N21/88
代理机构 代理人
主权项
地址
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