发明名称 物品検査装置及び物品検査方法
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a low-cost article inspection device that has settings of higher degree of freedom, and is higher in versatility and easy to handle by relaxing restrictions on arrangement of imaging means as compared with before while utilizing facilities of a conventional inspection device as much as possible. <P>SOLUTION: The article inspection device includes conveyance means 2 for conveying an article 11, first imaging means 3d for imaging the article 11 from above, second imaging means 3a, 3b for imaging the article sideward, and control means 6. The article inspection device acquires a top-surface image 12 and side-surface images 13, 14, regards a part having correspondence relation such that the length of the actual article is substantially equal as a reference part so as to measure a length of the reference part in the top-surface image as a first length L1, a length of the reference part in the side-surface images as a second length L2, and a length of a measurement part in the side-surface images as a third length L3, and corrects the third length L3 based upon the correspondence relation between the first length L1 and second length L2 to calculate a length X of the measurement part. <P>COPYRIGHT: (C)2012,JPO&INPIT</p>
申请公布号 JP5612370(B2) 申请公布日期 2014.10.22
申请号 JP20100133277 申请日期 2010.06.10
申请人 发明人
分类号 G01B11/02 主分类号 G01B11/02
代理机构 代理人
主权项
地址