发明名称 光学測定装置
摘要 <p>An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.</p>
申请公布号 JP5608919(B2) 申请公布日期 2014.10.22
申请号 JP20100038377 申请日期 2010.02.24
申请人 发明人
分类号 G01J1/02;G01J1/00;G01J3/443;G01M11/00 主分类号 G01J1/02
代理机构 代理人
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