| 摘要 |
The invention relates to a test adapter for an electronic product to be tested, the test adapter (TA) comprising a support structure (100) and a product stand (200) supported on the support structure for the product (DUT). The product stand is supported to the support structure (100) by a guide structure (301 to 304) that controls the vertical movement (U) of the product stand. The product stand (200) is arranged with a direct or indirect pressing movement from above to be movable from a top position (TOP) to its low position (LOW) supported by the guide structure (301 to 304). The test adapter comprises a retaining structure (701, 702) for retaining the product stand (200) in the low position (LOW) and for retaining a latch structure (501, 502) of the adapter in its locking position, the latch structure (501, 502) being arranged to lock the product to the product stand (200). |
