发明名称 PRODUCTION METHOD FOR SEMICONDUCTOR DEVICE
摘要 <p>A method for producing a semiconductor device includes an implantation step of performing proton implantation from a rear surface of a semiconductor substrate (101) of a first conductivity type and a formation step of performing an annealing process for the semiconductor substrate (101) in an annealing furnace to form a first semiconductor region of the first conductivity type which has a higher impurity concentration than the semiconductor substrate (101) after the implantation step. In the formation step, the furnace is in a hydrogen atmosphere and the volume concentration of hydrogen is in the range of 6% to 30%. Therefore, it is possible to reduce crystal defects in the generation of donors by proton implantation. In addition, it is possible to improve the rate of change into a donor.</p>
申请公布号 EP2793251(A1) 申请公布日期 2014.10.22
申请号 EP20130764611 申请日期 2013.03.18
申请人 FUJI ELECTRIC CO., LTD. 发明人 KOBAYASHI, YUSUKE;YOSHIMURA, TAKASHI
分类号 H01L21/265;H01L21/329;H01L21/331;H01L29/739;H01L29/861 主分类号 H01L21/265
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