Memory devices, testing systems and methods

摘要

Testing systems and methods, as well as memory devices using such testing systems and methods, may facilitate testing of memory devices using a read-modify-write test procedure. One such testing system receives a signal indicative of at least some of a plurality of bits of data read from an address differing from each other, and then masks subsequent write operations at the same address. Therefore, any address at which the bits of read data do not all have the same value may be considered to be faulty. Failure data from the test can therefore be stored in the same array of memory cells that is being tested.

主权项

1. An apparatus comprising:
error detect circuitry configured to provide an error signal having a value indicating an error responsive to detecting a read data error associated with a memory cell of an array of memory cells; a write mask circuit configured to provide a write mask signal responsive to receiving the error signal having the value indicating the error; and the array of memory cells, wherein the array is configured to store the read data error in the memory cell of the array with which the read data error is associated with.