发明名称 Method of operating nonvolatile memory device controlled by controlling coupling resistance value between bit line and page buffer
摘要 A method of operating a nonvolatile memory device includes determining whether a program operation is performed on even memory cells coupled to even bit lines of a selected page, setting a coupling resistance value between odd bit lines of the selected page and page buffers depending on whether the program operation for the even memory cells is performed, performing a program operation on the odd memory cells coupled to the odd bit lines, and coupling the odd bit line to the page buffer based on the set coupling resistance value and performing an verification operation for verifying whether threshold voltages of the odd memory cells on which the program operation is performed are a target voltage or more.
申请公布号 US8867274(B2) 申请公布日期 2014.10.21
申请号 US201213726861 申请日期 2012.12.26
申请人 SK Hynix Inc. 发明人 Choi Won Yeol;Lee Eun Jong
分类号 G11C16/04;G11C16/06;G11C16/10;G11C11/56;G11C16/34 主分类号 G11C16/04
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A method of operating a nonvolatile memory device, the method comprising: determining whether a most significant bit (MSB) program operation is performed on even memory cells coupled to even bit lines of a selected page; setting a coupling resistance value between odd bit lines of the selected page and page buffers depending on whether the MSB program operation for the even memory cells is performed; performing an MSB program operation on odd memory cells coupled to the odd bit lines; and performing an MSB verification operation for verifying whether threshold voltages of the odd memory cells on which the MSB program operation is performed are a first target voltage or more by coupling the odd bit line to the page buffer to the set-coupling resistance value.
地址 Gyeonggi-do KR