发明名称 |
Package structure having MEMS element |
摘要 |
A package structure having at least an MEMS element is provided, including a chip having electrical connecting pads and the MEMS element; a lid disposed on the chip to cover the MEMS element and having a metal layer provided thereon; first sub-bonding wires electrically connecting to the electrical connecting pads; second sub-bonding wires electrically connecting to the metal layer; an encapsulant disposed on the chip, wherein the top ends of the first and second sub-bonding wires are exposed from the encapsulant; and metallic traces disposed on the encapsulant and electrically connecting to the first sub-bonding wires. The package structure advantageously features reduced size, relatively low costs, diverse bump locations, and an enhanced EMI shielding effect. |
申请公布号 |
US8866236(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201012769993 |
申请日期 |
2010.04.29 |
申请人 |
Siliconware Precision Industries Co., Ltd. |
发明人 |
Chiu Chi-Hsin;Huang Chih-Ming;Chan Chang-Yueh;Liao Hsin-Yi;Ke Chun-Chi |
分类号 |
H01L29/84;H01L23/31;H01L21/56;B81B7/00;H01L23/552;H01L23/00 |
主分类号 |
H01L29/84 |
代理机构 |
Edwards Wildman Palmer LLP |
代理人 |
Edwards Wildman Palmer LLP ;Corless Peter F.;Jensen Steven M. |
主权项 |
1. A package structure having at least a Micro Electro Mechanical System (MEMS) element, comprising:
a chip provided thereon with a plurality of electrical connection pads and the at least an MEMS element; a lid disposed on the chip to cover the MEMS element; a metal layer only disposed on a top surface of the lid and in direct physical contact with the lid; a plurality of first sub-bonding wires electrically connecting to the electrical connection pads, respectively; a plurality of second sub-bonding wires electrically connecting to the metal layer; an encapsulant disposed on the chip to cover the lid, the first sub-bonding wires and the second sub-bonding wires, wherein top ends of the first sub-bonding wires and the second sub-bonding wires are exposed from a top surface of the encapsulant; and a plurality of metallic traces disposed on the encapsulant and electrically connected to the first sub-bonding wires. |
地址 |
Taichung TW |