发明名称 |
Method and device for determining test sets of operating parameter values for an electronic component |
摘要 |
A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set. |
申请公布号 |
US8868371(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201113228504 |
申请日期 |
2011.09.09 |
申请人 |
Infineon Technologies AG |
发明人 |
Pelz Georg;Nirmaier Thomas |
分类号 |
G01R31/00;H01L21/66;G01R31/28 |
主分类号 |
G01R31/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for determining test sets of operating parameter values for an electronic component, the method comprising:
determining a first set of intermediate sets, each intermediate set containing a combination of a first number of parameters chosen from a predefined parameter set containing a predefined number of parameters, wherein the parameters represent operating parameters of the electronic component and each parameter may have a number of parameter values; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set, wherein the number of the sets equals the second number of test sets within the third set. |
地址 |
Neubiberg DE |