发明名称 |
Tail effect correction for SLIM pattern touch panels |
摘要 |
Techniques for correcting tail effect are described herein. In an example embodiment, a device comprises a sensor coupled with a processing logic. The sensor is configured to measure a plurality of measurements from a sensor array, where the measurements are representative of a conductive object that is in contact with or proximate to the sensor array. The sensor array comprises RX electrodes and TX electrodes that are interleaved without intersecting each other in a single layer on a substrate of the sensor array. The processing logic is configured to determine a set of adjustment values that correspond to a tail effect associated with the measurements, and to generate adjusted measurements based on the set of adjustment values, where the adjusted measurements correct a parasitic signal change of the tail effect. |
申请公布号 |
US8866491(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201314038423 |
申请日期 |
2013.09.26 |
申请人 |
Cypress Semiconductor Corporation |
发明人 |
Ksondzyk Petro;Mandziy Vasyl;Kolych Igor;Badaye Massoud |
分类号 |
G01R35/00;G01R27/26;G06F3/041;G01N27/22 |
主分类号 |
G01R35/00 |
代理机构 |
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代理人 |
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主权项 |
1. A device comprising:
a sensor array comprising a plurality of receive (RX) electrodes and a plurality of transmit (TX) electrodes, wherein the plurality of RX electrodes and the plurality of TX electrodes are interleaved without intersecting each other within a touch-sensing area in a single layer on a substrate of the sensor array; a sensor configured to measure a plurality of measurements from the sensor array, wherein the plurality of measurements are representative of a conductive object that is in contact with or proximate to the sensor array; and a processing logic coupled with the sensor, wherein the processing logic is configured at least to:
determine a set of adjustment values that correspond to a tail effect associated with the conductive object represented by the plurality of measurements;wherein adjustment values for a particular TX electrode are computed based on a sum of indices of RX electrodes along the particular TX electrode; andgenerate adjusted measurements corresponding to the conductive object represented by the plurality of measurements based on the set of adjustment values, wherein the adjusted measurements correct the tail effect. |
地址 |
San Jose CA US |