发明名称 |
Silicon carbide semiconductor device and method for manufacturing same |
摘要 |
A silicon carbide semiconductor device includes a silicon carbide substrate and a contact electrode. The silicon carbide substrate includes an n type region and a p type region that makes contact with the n type region. The contact electrode makes contact with the n type region and the p type region. The contact electrode contains Ni atoms and Si atoms. The number of the Ni atoms is not less than 87% and not more than 92% of the total number of the Ni atoms and the Si atoms. Accordingly, there can be provided a silicon carbide semiconductor device, which can achieve ohmic contact with an n type impurity region and can achieve a low contact resistance for a p type impurity region, as well as a method for manufacturing such a silicon carbide semiconductor device. |
申请公布号 |
US8866156(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US201313895848 |
申请日期 |
2013.05.16 |
申请人 |
Sumitomo Electric Industries, Ltd. |
发明人 |
Yamada Shunsuke;Tamaso Hideto |
分类号 |
H01L21/44;H01L29/94;H01L31/0312;H01L29/16;H01L21/3205 |
主分类号 |
H01L21/44 |
代理机构 |
Venable LLP |
代理人 |
Venable LLP ;Sartori Michael A. |
主权项 |
1. A silicon carbide semiconductor device comprising:
a silicon carbide substrate including an n type region and a p type region that makes contact with said n type region; and a contact electrode that makes contact with said n type region and said p type region, said contact electrode containing Ni atoms and Si atoms, the number of said Ni atoms being not less than 87% and not more than 92% of a total number of said Ni atoms and said Si atoms. |
地址 |
Osaka-shi JP |