发明名称 |
METHODS OF FORMING A FIELD EFFECT TRANSISTOR, INCLUDING FORMING A REGION PROVIDING ENHANCED OXIDATION |
摘要 |
<p>Provided is a method to manufacture a semiconductor device capable of improving the performance and reliability of a semiconductor device by forming a region providing enhanced oxidation. The method comprises: implanting ions into a substrate having a fin-type body protruding from the substrate, wherein the fin-type body overlaps a part of the implanted region of the ions; recessing the substrate to remove parts of the implanted region exposed by the fin-type body wherein the fin-type body overlaps a remaining part of the implanted region; forming an isolation layer on the substrate and on the sidewall of the remaining part of the implanted region; and oxidizing the remaining part of the implanted region.</p> |
申请公布号 |
KR20140122166(A) |
申请公布日期 |
2014.10.17 |
申请号 |
KR20130145594 |
申请日期 |
2013.11.27 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
RODDER MARK S.;SEO, KANG ILL |
分类号 |
H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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