发明名称 METHODS OF FORMING A FIELD EFFECT TRANSISTOR, INCLUDING FORMING A REGION PROVIDING ENHANCED OXIDATION
摘要 <p>Provided is a method to manufacture a semiconductor device capable of improving the performance and reliability of a semiconductor device by forming a region providing enhanced oxidation. The method comprises: implanting ions into a substrate having a fin-type body protruding from the substrate, wherein the fin-type body overlaps a part of the implanted region of the ions; recessing the substrate to remove parts of the implanted region exposed by the fin-type body wherein the fin-type body overlaps a remaining part of the implanted region; forming an isolation layer on the substrate and on the sidewall of the remaining part of the implanted region; and oxidizing the remaining part of the implanted region.</p>
申请公布号 KR20140122166(A) 申请公布日期 2014.10.17
申请号 KR20130145594 申请日期 2013.11.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 RODDER MARK S.;SEO, KANG ILL
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址