| 摘要 |
The present invention relates to an electronic component testing apparatus. The electronic component testing apparatus of the present invention includes: a plate which has multiple pockets into which an inserted electronic component is inserted respectively and multiple electrode patterns between the pockets; a pair of measuring terminals which is installed on the upper part of the plate and sequentially comes into contact with the electronic component and the electrode patterns; and a measuring device electrically connected to the measuring terminals. |
