发明名称 REFRACTIVE INDEX DISTRIBUTION-MEASURING REFERENCE ELEMENT, AND DEVICE AND METHOD FOR MEASURING REFRACTIVE INDEX DISTRIBUTION
摘要 <p>PROBLEM TO BE SOLVED: To provide a refractive index distribution-measuring reference element capable of further accurately measuring refractive index distribution of an optical element subject to a measurement without processing the optical element subject to the measurement, and to provide a device and method for measuring the refractive index distribution.SOLUTION: A refractive index distribution-measuring reference element for use in a measurement of the refractive index distribution in an optical element subject to a measurement includes a pair of first and second reference elements for clamping the optical element subject to the measurement. At least one of the first and second reference elements has one principal surface, the shape of which is inverse to a surface shape of the optical element subject to the measurement.</p>
申请公布号 JP2014196966(A) 申请公布日期 2014.10.16
申请号 JP20130073169 申请日期 2013.03.29
申请人 KONICA MINOLTA INC 发明人 WAKITA KOICHI
分类号 G01N21/01;G01M11/02;G01N21/45 主分类号 G01N21/01
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