发明名称 |
Electrical Measurement Based Circuit Wiring Layout Modification Method and System |
摘要 |
The capacitance or inductance of electrical circuits is adjusted by measuring inductance or capacitance values of passive components fabricated on a first substrate, storing individual associations between the passive components and the respective measured values of the passive components, and determining electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components. A corresponding system includes a tester operable to measure inductance or capacitance values of the passive components fabricated on the first substrate, a storage system operable to store the individual associations between the passive components and the respective measured values of the passive components, and a processing circuit operable to determine the electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components. |
申请公布号 |
US2014310671(A1) |
申请公布日期 |
2014.10.16 |
申请号 |
US201313863740 |
申请日期 |
2013.04.16 |
申请人 |
Infineon Technologies AG |
发明人 |
Beer Gottfried;Maier Dominic;Metzger-Brückl Gerhard;Leuschner Rainer |
分类号 |
G06F17/50 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
1. A method of adjusting the capacitance or inductance of electrical circuits, the method comprising:
measuring inductance or capacitance values of passive components fabricated on a first substrate; storing individual associations between the passive components and the respective measured values of the passive components; and determining electrical connections for the passive components based on the stored individual associations between the passive components and the respective measured values of the passive components. |
地址 |
Neubiberg DE |