发明名称 |
DETECTION OF PLATING ON WAFER-HOLDING APPARATUS |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide methods and apparatus for detecting whether unwanted metallic deposits are present on a bottom of a substrate holder used in an electroplating apparatus.SOLUTION: A method comprises: positioning detection hardware 106 in the proximity of a substrate holder of an electroplating apparatus, where the substrate holder is an annular element having a bottom and an interior edge, and where the substrate holder is configured to support a substrate during electroplating; and operating the detection hardware 106 to detect the presence or absence of metal deposits in a detection region on the substrate holder.</p> |
申请公布号 |
JP2014196555(A) |
申请公布日期 |
2014.10.16 |
申请号 |
JP20140026848 |
申请日期 |
2014.02.14 |
申请人 |
LAM RESEARCH CORPORATION |
发明人 |
STEVEN T MAYER;HAIYING FU;THOMAS ANAND PONNUSWAMY;BRYAN L BUCKALEW |
分类号 |
C25D7/12;C25D17/06;G01N21/956;G01N27/20;G01N27/90;H01L21/288 |
主分类号 |
C25D7/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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