发明名称 DETECTION OF PLATING ON WAFER-HOLDING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide methods and apparatus for detecting whether unwanted metallic deposits are present on a bottom of a substrate holder used in an electroplating apparatus.SOLUTION: A method comprises: positioning detection hardware 106 in the proximity of a substrate holder of an electroplating apparatus, where the substrate holder is an annular element having a bottom and an interior edge, and where the substrate holder is configured to support a substrate during electroplating; and operating the detection hardware 106 to detect the presence or absence of metal deposits in a detection region on the substrate holder.</p>
申请公布号 JP2014196555(A) 申请公布日期 2014.10.16
申请号 JP20140026848 申请日期 2014.02.14
申请人 LAM RESEARCH CORPORATION 发明人 STEVEN T MAYER;HAIYING FU;THOMAS ANAND PONNUSWAMY;BRYAN L BUCKALEW
分类号 C25D7/12;C25D17/06;G01N21/956;G01N27/20;G01N27/90;H01L21/288 主分类号 C25D7/12
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