MECHANICAL DETECTION OF RAMAN RESONANCE

摘要

An atomic force microscope based apparatus and method for detecting Raman effect on a sample of interest utilizes first and second electromagnetic sources to emit first electromagnetic radiation of frequency Vi and second electromagnetic radiation of frequency V2 onto a probe tip, which is coupled to a structure that can oscillate the probe tip. The frequency Vi and the frequency v2 are selected to induce Raman effect on a sample engaged by the probe tip that results in Raman force interactions between the probe tip and the sample. Oscillations of the probe tip due to the Raman force interactions are then measured.

主权项

1. An atomic force microscope based apparatus comprising:
a probe tip for engaging a sample of interest, the probe tip being coupled to a structure that can oscillate the probe tip; first and second electromagnetic sources, the first electromagnetic source configured to emit first electromagnetic radiation at frequency ν1 onto the probe tip and the second electromagnetic source configured to emit second electromagnetic radiation at frequency ν2 onto the probe tip, wherein the frequency ν1 and the frequency ν2 are selected to induce Raman effect on the sample that results in Raman force interactions between the probe tip and the sample; and a sensor configured to measure oscillations of the probe tip due to the Raman force interactions between the probe tip and the sample.