| 发明名称 |
CRYSTALLIZED SAMPLE INSPECTION APPARATUS |
| 摘要 |
A sample inspection apparatus is provided. A sample inspection apparatus according to an exemplary embodiment of the present invention includes a base; a loading portion installed on the base so that a sample is placed thereon; a first light source radiating light on the sample, the sample being placed on the loading portion; a first light receiving portion located at a first position and receiving light reflected and scattered by the sample; and a support portion positioned on the loading portion so that the first light source and the first light receiving portion are movably installed on the support portion. |
| 申请公布号 |
US2014307080(A1) |
申请公布日期 |
2014.10.16 |
| 申请号 |
US201314056191 |
申请日期 |
2013.10.17 |
| 申请人 |
SAMSUNG DISPLAY CO., LTD. |
发明人 |
KIM Ki-Hyun;PARK Young-Gil;KIM Shang-U;OH Ki-Won |
| 分类号 |
G01N21/95 |
主分类号 |
G01N21/95 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A sample inspection apparatus comprising:
a base; a loading portion installed on the base so that a sample is placed thereon; a first light source radiating light on the sample, the sample being placed on the loading portion; a first light receiving portion located at a first position and receiving light reflected and scattered by the sample; and a support portion positioned on the loading portion so that the first light source and the first light receiving portion are movably installed on the support portion. |
| 地址 |
Yongin-City KR |
