发明名称 NONVOLATILE MEMORY DEVICE
摘要 <p>The present invention is to provide a nonvolatile memory device capable of reducing the overall area by reducing the peripheral circuit area. The nonvolatile memory device comprises: a gate structure which includes a select gate on a substrate and a memory gate formed on one side wall of the substrate, and has a P-channel; a drain area formed on one substrate of the gate structure and overlapped with a portion of the memory gate; and a source area formed on the other substrate of the gate structure and overlapped with a portion of the select gate.</p>
申请公布号 KR20140121614(A) 申请公布日期 2014.10.16
申请号 KR20130038041 申请日期 2013.04.08
申请人 SK HYNIX INC. 发明人 PARK, SUNG KUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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