发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME
摘要 <p>This silicon carbide semiconductor device (1) comprises a silicon carbide substrate (10) and a contact electrode (16). The silicon carbide substrate (10) includes an n-type region (14) and a p-type region (18) that is in contact with the n-type region (14). The contact electrode (16) is in contact with the n-type region (14) and the p-type region (18). The contact electrode (16) includes Ni atoms and Si atoms. The number of Ni atoms is from 87% to 92%, inclusive, of the total number of Ni atoms and Si atoms. Thus, it is possible to provide a silicon carbide semiconductor device that is capable of making ohmic contact with an n-type impurity region and capable of achieving low contact resistance with respect to a p-type impurity region, and a method for producing said silicon carbide semiconductor device.</p>
申请公布号 WO2013190901(A9) 申请公布日期 2014.10.16
申请号 WO2013JP61917 申请日期 2013.04.23
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 YAMADA, SHUNSUKE;TAMASO, HIDETO
分类号 H01L21/28;H01L21/336;H01L29/12;H01L29/78 主分类号 H01L21/28
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