发明名称 |
SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME |
摘要 |
<p>This silicon carbide semiconductor device (1) comprises a silicon carbide substrate (10) and a contact electrode (16). The silicon carbide substrate (10) includes an n-type region (14) and a p-type region (18) that is in contact with the n-type region (14). The contact electrode (16) is in contact with the n-type region (14) and the p-type region (18). The contact electrode (16) includes Ni atoms and Si atoms. The number of Ni atoms is from 87% to 92%, inclusive, of the total number of Ni atoms and Si atoms. Thus, it is possible to provide a silicon carbide semiconductor device that is capable of making ohmic contact with an n-type impurity region and capable of achieving low contact resistance with respect to a p-type impurity region, and a method for producing said silicon carbide semiconductor device.</p> |
申请公布号 |
WO2013190901(A9) |
申请公布日期 |
2014.10.16 |
申请号 |
WO2013JP61917 |
申请日期 |
2013.04.23 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
YAMADA, SHUNSUKE;TAMASO, HIDETO |
分类号 |
H01L21/28;H01L21/336;H01L29/12;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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