发明名称 |
DIFFRACTION GRATING, DIFFRACTION GRATING ELEMENT, AND CHARGED PARTICLE BEAM DEVICE EQUIPPED WITH SAME |
摘要 |
<p>This charged particle beam device generates an electron vortex beam by passing a charged particle beam through (A) a diffraction grating which includes a plurality of edge dislocations of differing orders, or (B) a diffraction grating element comprising a plurality of diffraction gratings which include edge dislocations of differing orders. The electron vortex beam has a plurality of ring-like diffraction spots of differing diameters which overlap on the diffraction image plane, and therefore is suited to devices for which it is necessary to irradiate a wide sample region, such as a transmission electron microscope.</p> |
申请公布号 |
WO2014167884(A1) |
申请公布日期 |
2014.10.16 |
申请号 |
WO2014JP52332 |
申请日期 |
2014.01.31 |
申请人 |
HITACHI, LTD. |
发明人 |
HARADA, KEN;KOHASHI, TERUO;IWANE, TOMOHIRO;TAMAKI, HIROKAZU |
分类号 |
H01J37/26 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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