发明名称 Creating deep trenches on underlying substrate
摘要 A semiconductor structure is disclosed in which, in an embodiment, a first substrate includes at least one buried plate disposed in an upper part of the first substrate. Each of the at least one buried plate includes at least one buried plate contact, and a plurality of deep trench capacitors disposed about the at least one buried plate contact. A first oxide layer is disposed over the first substrate. The deep trench capacitors and buried plate contacts in the first substrate may be accessed for use in a variety of memory and decoupling applications.
申请公布号 US8860113(B2) 申请公布日期 2014.10.14
申请号 US201314036474 申请日期 2013.09.25
申请人 International Business Machines Corporation 发明人 Appleyard Jennifer E.;Barth John E.;DeForge John B.;Ho Herbert L.;Khan Babar A.;Peterson Kirk D.;Turner Andrew A.
分类号 H01L27/108 主分类号 H01L27/108
代理机构 Hoffman Warnick LLC 代理人 LeStrange Michael J.;Hoffman Warnick LLC
主权项 1. A structure comprising: a first substrate, the first substrate including: at least one buried plate disposed in an upper part of the first substrate, the at least one buried plate being between about 3.5 μm and about 4 μm thick, wherein each of the at least one buried plate includes:at least one buried plate contact,a plurality of deep trench capacitors disposed about the at least one buried plate contact, each of the plurality of deep trench capacitors having an insulating liner, wherein the insulating liner is one of silicon oxide, silicon nitride, HfO2, or HfSiO2; and a first oxide layer disposed over the first substrate.
地址 Armonk NY US