发明名称 |
Multi-step contrast sensitivity gauge |
摘要 |
An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image. |
申请公布号 |
US8858076(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201113241569 |
申请日期 |
2011.09.23 |
申请人 |
Sandia Corporation |
发明人 |
Quintana Enrico C.;Thompson Kyle R.;Moore David G.;Heister Jack D.;Poland Richard W.;Ellegood John P.;Hodges George K.;Prindville James E. |
分类号 |
A61B6/03;G21K1/10 |
主分类号 |
A61B6/03 |
代理机构 |
Medley Behrens & Lewis LLC |
代理人 |
Medley Behrens & Lewis LLC ;Doudnikoff Gregory M. |
主权项 |
1. A multi-step X-ray contrast sensitivity gauge, comprising:
a first step comprising: a first planar top face; and a first planar bottom face, the first planar top face being parallel to the first planar bottom face, the first step having a first thickness between the first planar top face and the first planar bottom face, the first planar top face comprising a first plurality of recesses of differing depths; and a second step comprising: a second planar top face; and a second planar bottom face, the second planar top face being parallel to the second planar bottom face, the second step having a second thickness between the second planar top face and the second planar bottom face that is greater than the first thickness, the second planar top face comprising a second plurality of recesses of differing depths; the first planar bottom face of the first step being coplanar with the second planar bottom face of the second step. |
地址 |
Albuquerque NM US |