发明名称 Multi-step contrast sensitivity gauge
摘要 An X-ray contrast sensitivity gauge is described herein. The contrast sensitivity gauge comprises a plurality of steps of varying thicknesses. Each step in the gauge includes a plurality of recesses of differing depths, wherein the depths are a function of the thickness of their respective step. An X-ray image of the gauge is analyzed to determine a contrast-to-noise ratio of a detector employed to generate the image.
申请公布号 US8858076(B2) 申请公布日期 2014.10.14
申请号 US201113241569 申请日期 2011.09.23
申请人 Sandia Corporation 发明人 Quintana Enrico C.;Thompson Kyle R.;Moore David G.;Heister Jack D.;Poland Richard W.;Ellegood John P.;Hodges George K.;Prindville James E.
分类号 A61B6/03;G21K1/10 主分类号 A61B6/03
代理机构 Medley Behrens & Lewis LLC 代理人 Medley Behrens & Lewis LLC ;Doudnikoff Gregory M.
主权项 1. A multi-step X-ray contrast sensitivity gauge, comprising: a first step comprising: a first planar top face; and a first planar bottom face, the first planar top face being parallel to the first planar bottom face, the first step having a first thickness between the first planar top face and the first planar bottom face, the first planar top face comprising a first plurality of recesses of differing depths; and a second step comprising: a second planar top face; and a second planar bottom face, the second planar top face being parallel to the second planar bottom face, the second step having a second thickness between the second planar top face and the second planar bottom face that is greater than the first thickness, the second planar top face comprising a second plurality of recesses of differing depths; the first planar bottom face of the first step being coplanar with the second planar bottom face of the second step.
地址 Albuquerque NM US