发明名称 Compositions used in formation of oxide material layers, methods of forming an oxide material layer using the same, and methods of fabricating a thin film transistor using same
摘要 Methods of forming an oxide material layer are provided. The method includes mixing a precursor material with a peroxide material to form a precursor solution, coating the precursor solution on a substrate, and baking the coated precursor solution.
申请公布号 US8859331(B2) 申请公布日期 2014.10.14
申请号 US201213523978 申请日期 2012.06.15
申请人 Industry-Academic Cooperation Foundation, Yonsei University 发明人 Kim Hyun Jae;Kim Dong Lim;Jung Joohye;Rim You Seung
分类号 H01L21/00;H01L21/16;H01L21/02 主分类号 H01L21/00
代理机构 Carter, DeLuca, Farrell & Schmidt, LLP 代理人 Carter, DeLuca, Farrell & Schmidt, LLP
主权项 1. A method of forming an oxide material layer, comprising: (a) mixing a precursor material with a peroxide material to form a precursor solution; (b) coating the precursor solution on a substrate; and (c) baking the coated precursor solution.
地址 Seoul KR