发明名称 |
Compositions used in formation of oxide material layers, methods of forming an oxide material layer using the same, and methods of fabricating a thin film transistor using same |
摘要 |
Methods of forming an oxide material layer are provided. The method includes mixing a precursor material with a peroxide material to form a precursor solution, coating the precursor solution on a substrate, and baking the coated precursor solution. |
申请公布号 |
US8859331(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201213523978 |
申请日期 |
2012.06.15 |
申请人 |
Industry-Academic Cooperation Foundation, Yonsei University |
发明人 |
Kim Hyun Jae;Kim Dong Lim;Jung Joohye;Rim You Seung |
分类号 |
H01L21/00;H01L21/16;H01L21/02 |
主分类号 |
H01L21/00 |
代理机构 |
Carter, DeLuca, Farrell & Schmidt, LLP |
代理人 |
Carter, DeLuca, Farrell & Schmidt, LLP |
主权项 |
1. A method of forming an oxide material layer, comprising:
(a) mixing a precursor material with a peroxide material to form a precursor solution; (b) coating the precursor solution on a substrate; and (c) baking the coated precursor solution. |
地址 |
Seoul KR |