发明名称 |
Patterning process |
摘要 |
A patterning process comprises (a) providing at least one substrate having at least one major surface; (b) providing at least one patterning composition comprising at least one functionalizing molecule that is a perfluoropolyether organosulfur compound; (c) applying the patterning composition to the major surface of the substrate in a manner so as to form at least one functionalized region and at least one unfunctionalized region of the major surface; and (d) etching at least a portion of the unfunctionalized region. |
申请公布号 |
US8858813(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US200913130320 |
申请日期 |
2009.12.02 |
申请人 |
3M Innovative Properties Company |
发明人 |
Zu Lijun;Frey Matthew H.;Iyer Suresh S. |
分类号 |
C03C15/00;C07C323/60;B05D1/18;B82Y30/00;B82Y40/00;C07C323/41;C07C323/52;C08G65/00;C08G65/334;C09D171/02;G03F7/00 |
主分类号 |
C03C15/00 |
代理机构 |
|
代理人 |
Weiss Lucy C. |
主权项 |
1. A process comprising (a) providing at least one substrate having at least one major surface comprising at least one elemental metal, at least one metal alloy, at least one metal-containing compound, or a combination thereof; (b) providing at least one patterning composition comprising at least one functionalizing molecule that is a perfluoropolyether organosulfur compound comprising at least one perfluoropolyether segment selected from F[CF(CF3)CF2O]aCF(CF3)—, wherein a has an average value of 4 to 20, and —CF(CF3)(OCF2CF(CF3)bOCF2CF2CF2CF2O(CF(CF3)CF2O)cCF(CF3)—, wherein b+c has an average value of 4 to 15; (c) applying said patterning composition to said major surface of said substrate in a manner so as to form at least one functionalized region and at least one unfunctionalized region of said major surface; and (d) etching at least a portion of said unfunctionalized region. |
地址 |
St. Paul MN US |