发明名称 ESD protection element
摘要 In an aspect of the present invention, an ESD (Electrostatic Discharge) protection element includes a bipolar transistor comprising a collector diffusion layer connected with a first terminal and an emitter diffusion layer; and current control resistances provided for a plurality of current paths from a second terminal to the collector diffusion layer through the emitter diffusion layer, respectively. The bipolar transistor further includes a base diffusion region connected with the second terminal through a first resistance which is different from the current control resistances.
申请公布号 US8860139(B2) 申请公布日期 2014.10.14
申请号 US201012722000 申请日期 2010.03.11
申请人 Renesas Electronics Corporation 发明人 Sawahata Kouichi
分类号 H01L21/8222;H01L21/8228;H01L27/02;H01L27/102 主分类号 H01L21/8222
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. An ESD (Electrostatic Discharge) protection element comprising: a bipolar transistor comprising: a collector diffusion layer connected with a first terminal;a base diffusion layer; andan emitter diffusion layer; a first wire connected to the emitter diffusion layer and the base diffusion layer; a second wire connected to the emitter diffusion layer and the base diffusion layer; a first current control resistance connected to a second terminal, and connected to the first wire by a first contact; a second current control resistance connected to the second terminal, and connected to the second wire by a second contact, wherein the collector diffusion layer and the emitter diffusion layer are each arranged in a base width direction, the first and second wires and the first and second current control resistances are each arranged in a direction that is perpendicular to the base width direction, and wherein current flowing out to a power supply voltage is distributed to flow through the first and second current control resistances in order to reduce current concentration in a breakdown path.
地址 Kanagawa JP
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