发明名称 |
ESD protection element |
摘要 |
In an aspect of the present invention, an ESD (Electrostatic Discharge) protection element includes a bipolar transistor comprising a collector diffusion layer connected with a first terminal and an emitter diffusion layer; and current control resistances provided for a plurality of current paths from a second terminal to the collector diffusion layer through the emitter diffusion layer, respectively. The bipolar transistor further includes a base diffusion region connected with the second terminal through a first resistance which is different from the current control resistances. |
申请公布号 |
US8860139(B2) |
申请公布日期 |
2014.10.14 |
申请号 |
US201012722000 |
申请日期 |
2010.03.11 |
申请人 |
Renesas Electronics Corporation |
发明人 |
Sawahata Kouichi |
分类号 |
H01L21/8222;H01L21/8228;H01L27/02;H01L27/102 |
主分类号 |
H01L21/8222 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. An ESD (Electrostatic Discharge) protection element comprising:
a bipolar transistor comprising:
a collector diffusion layer connected with a first terminal;a base diffusion layer; andan emitter diffusion layer; a first wire connected to the emitter diffusion layer and the base diffusion layer; a second wire connected to the emitter diffusion layer and the base diffusion layer; a first current control resistance connected to a second terminal, and connected to the first wire by a first contact; a second current control resistance connected to the second terminal, and connected to the second wire by a second contact, wherein the collector diffusion layer and the emitter diffusion layer are each arranged in a base width direction, the first and second wires and the first and second current control resistances are each arranged in a direction that is perpendicular to the base width direction, and wherein current flowing out to a power supply voltage is distributed to flow through the first and second current control resistances in order to reduce current concentration in a breakdown path. |
地址 |
Kanagawa JP |