发明名称 Specimen holder used for mounting samples in electron microscopes
摘要 A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
申请公布号 US8859991(B2) 申请公布日期 2014.10.14
申请号 US201313799871 申请日期 2013.03.13
申请人 Protochips, Inc. 发明人 Nackashi David P.;Damiano, Jr. John;Mick Stephen E.;Schmelzer Thomas G.;Zapata, III Michael
分类号 H01J37/20;G01N1/28 主分类号 H01J37/20
代理机构 Moore & Van Allen, PLLC 代理人 Fuierer Tristan A.;Moore & Van Allen, PLLC
主权项 1. An electron microscope specimen holder comprising a body, a clipping means, a spring, a viewing region, and at least one guide mechanism, wherein the clipping means comprise an article of manufacture having a top surface, a bottom surface, a first end, a securing means, a second end, and at least one electrical contact integrated on and/or in the bottom surface of the article, and wherein the spring is in contact with the bottom surface of the second end of the article and, provides constant force to displace the first end of the article, and, wherein the securing means are positioned between the first end and the second end of the article.
地址 Raleigh NC US