发明名称 SEMICONDUCTOR DEVICE, LIGHT MEASURING APPARATUS, LIGHT DETECTING APPARATUS, AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
摘要 <p>Disclosed is a semiconductor device which is capable of preventing operation of the signal processing part from being unstable due to light not blocked by the light blocking layer by being obliquely incident on the signal processing part and preventing the operation of the signal processing part from being unstable due to stray charges occurring by light with which the light blocking layer is irradiated. In a light-incident part 12 having a light receiving element 36 and a signal processing circuit 38 that processes an output signal from the light receiving element 36, which are formed on a SOI substrate, a plurality of contact plugs 52 electrically connected to the light blocking layer 42 are laminated in the thickness direction of the SOI substrate along an edge of the light blocking layer that blocks the sunlight, with the uppermost of wiring layers on the signal processing circuit 38 as the light blocking layer 42. The plurality of contact plugs 52 have a ground or a potential sufficient to draw out stray charges occurring in the light blocking layer.</p>
申请公布号 KR101450342(B1) 申请公布日期 2014.10.14
申请号 KR20080030368 申请日期 2008.04.01
申请人 发明人
分类号 H01L31/12 主分类号 H01L31/12
代理机构 代理人
主权项
地址
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